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TESCAN SEM S9000 for Nanocharacterization at Low Beam Energies , The TESCAN S9000 features the Triglav™ SEM column for ultra-high resolution with excellent performance, especially at low electron beam energies
The TESCAN S9000 features the Triglav™ SEM column for ultra-high resolution with excellent performance, especially at low electron beam energies
TESCAN S8000 BrightBeam™ SEM Column Technology, This technology delivers excellent beam quality at all beam currents and first-class imaging performance with outstanding contrast at low beam energies
This technology delivers excellent beam quality at all beam currents and first-class imaging performance with outstanding contrast at low beam energies
TESCAN SEM MIRA, Its excellent resolution at high beam currents has proven to be especially advantageous for EDX, WDX and EBSD compositional analyses
Its excellent resolution at high beam currents has proven to be especially advantageous for EDX, WDX and EBSD compositional analyses
TESCAN SEM VEGA Thermionic Emission SEM System, The modes are Resolution, Depth, Field, Wide Field, Channeling. The operation is very easy and switching between the different imaging modes is straightforward and fast as they are fully automated
The modes are Resolution, Depth, Field, Wide Field, Channeling. The operation is very easy and switching between the different imaging modes is straightforward and fast as they are fully automated
TESCAN FIB-SEM S8000G with The new SEM Column - the BrightBeamTM, The TESCAN S8000G provides the benefit of versatility packaged with field-free ultra-high resolution imaging, including the analysis of magnetic samples and live SEM monitoring of your FIB operations
The TESCAN S8000G provides the benefit of versatility packaged with field-free ultra-high resolution imaging, including the analysis of magnetic samples and live SEM monitoring of your FIB operations
TESCAN S8000X Analytical Xe Plasma FIB-SEM Platform, The ideal platform for planar delayering, low-kV SEM inspection, and electrical nanoprobing of sub-20 nm node technologies
The ideal platform for planar delayering, low-kV SEM inspection, and electrical nanoprobing of sub-20 nm node technologies
TESCAN FIB-SEM SOLARIS, Advanced UHR FIB-SEM for 2D and 3D characterization of your biological and beam-sensitive samples. Site-specific TEM lamella preparation and in-situ visualization, Routine investigation, Ga FIB column with optimized ion optics
Advanced UHR FIB-SEM for 2D and 3D characterization of your biological and beam-sensitive samples. Site-specific TEM lamella preparation and in-situ visualization, Routine investigation, Ga FIB column with optimized ion...
TESCAN FIB-SEM SOLARIS X, A Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis, low keVs ultra-high resolution for surface sensitivity and high material contrast, SEM-monitoring during FIB milling, FIB-cross-sections up to 1 mm wide
A Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis, low keVs ultra-high resolution for surface sensitivity and high material contrast, SEM-monitoring...
TESCAN MICRO-CT UNITOM XL,Multi-scale non-destructive 3D imaging optimized to maximize throughput and contrast. Fast scanning and high sample throughput with temporal resolutions below 10 seconds. Wide array of samples types that enables dynamic tomography and in-situ experiments
Multi-scale non-destructive 3D imaging optimized to maximize throughput and contrast. Fast scanning and high sample throughput with temporal resolutions below 10 seconds. Wide array of samples types that enables dynamic...
TESCAN MICRO-CT DYNATOM, Optimized dynamic CT for in-situ research and imaging of delicate samples in a unique gantry-based design. Continuous scanning under 10 seconds per rotation with a software tools for 4D acquisition and reconstruction and dynamic screening for synchrotron beamtime
Optimized dynamic CT for in-situ research and imaging of delicate samples in a unique gantry-based design. Continuous scanning under 10 seconds per rotation with a software tools for 4D acquisition and reconstruction...
TESCAN SE Detectors, TESCAN BSE Detectors, TESCAN Beam Deceleration Technology Detectors, TESCAN Electron Backscatter Diffraction Detectors, TESCAN STEM Detectors, TESCAN CL Detectors, TESCAN Low Vacuum Secondary Electron Detectors,TESCAN Electron Beam Induced Current Detectors, TESCAN X-ray Spectrometry Detectors, TESCAN Secondary Ion TESCAN Detectors, TESCAN TOF-SIMS Detectors
SE Detectors, BSE Detectors, Beam Deceleration Technology Detectors, Electron Backscatter Diffraction Detectors, STEM Detectors, CL Detectors, Low Vacuum Secondary Electron Detectors,Electron Beam Induced Current...
Horiba Glow Discharge Optical Emission Spectrometry (GDOES), Profiling of all types of solid samples with optimum performance; from the first nanometer, to more than 150µm. Polymeric materials sputtering, Scanning Electron Microscopy (SEM) sample surfaces Preparation for Hydrogen, Deuterium, Lithium, Carbon, Nitrogen, Oxygen, and more
Profiling of all types of solid samples with optimum performance; from the first nanometer, to more than 150µm. Polymeric materials sputtering, Scanning Electron Microscopy (SEM) sample surfaces Preparation for Hydrogen...
Horiba Spectroscopic Ellipsometry, Spectroscopic ellipsometry allows a range of thin film properties to be characterized, like layer thickness, optical properties (n,k), optical band gap, interface and roughness thickness, film composition, uniformity by depth and area, and more.
Spectroscopic ellipsometry allows a range of thin film properties to be characterized, like layer thickness, optical properties (n,k), optical band gap, interface and roughness thickness, film composition, uniformity by...
HORIBA Laser Scattering Particle Size Distribution Analyzer, Measure particle size between 10 nanometers and 5 millimeters, resolves peaks at 30 nanometers, Suitable for suspensions, emulsions, powders, pastes, gels, and creams. Requires only micrograms of sample, Fully automated measurement sequences maximize precision and method compliance.
Measure particle size between 10 nanometers and 5 millimeters, resolves peaks at 30 nanometers, Suitable for suspensions, emulsions, powders, pastes, gels, and creams. Requires only micrograms of sample, Fully automated...
Quorom Sputter Coaters and SEM/ TEM Carbon Coaters, Low-cost, rotary-pumped sputter coaters for depositing non-oxidising metals - such as gold (Au) and platinum (Pt) - and turbomolecular-pumped coaters, suitable for both oxidising and non-oxidising metals
Low-cost, rotary-pumped sputter coaters for depositing non-oxidising metals - such as gold (Au) and platinum (Pt) - and turbomolecular-pumped coaters, suitable for both oxidising and non-oxidising metals
HORIBA Partica mini LA-350 Laser Scattering Particle Analyzer, Range: 0.1 - 1,000 µm which matches the widest range of applications. Compact Size that preserves bench space. Fast Analysis: Measurement results in three easy steps: click, add sample, and review data. Powerful Software: Fully featured software package for LA-series analyzers. Automatic alignment. Extremely easy and straightforward. Sample analysis can be a one-button operation.
Range: 0.1 - 1,000 µm which matches the widest range of applications. Compact Size that preserves bench space. Fast Analysis: Measurement results in three easy steps: click, add sample, and review data. Powerful...
Quorom Cryo-SEM Preparation Systems, Highly automated, column-mounted, gas-cooled cryo sem preparation and cryo transfer system suitable for most makes and models of W-SEM, FE-SEM and FIB/SEM
Highly automated, column-mounted, gas-cooled cryo sem preparation and cryo transfer system suitable for most makes and models of W-SEM, FE-SEM and FIB/SEM
Quorom Peltier Cooling Stages for SEM, Developed for use in low vacuum and natural SEMs, peltier-cooled stages accurately control dehydration from wet specimens.
Developed for use in low vacuum and natural SEMs, peltier-cooled stages accurately control dehydration from wet specimens.   
HORIBA Nanoparticle Analyzer, nanoPartica SZ-100V2 Series. Particle Size Measurement Range 0.3 nm to 10 µm, Zeta Potential Measurement – 500 to + 500 mV, Molecular weight 1 × 103 to 2 × 107 Da, The SZ-100V2 Series applies sophisticated intelligence and learning capability to rapidly determine nanoparticle properties!
nanoPartica SZ-100V2 Series. Particle Size Measurement Range 0.3 nm to 10 µm, Zeta Potential Measurement – 500 to + 500 mV, Molecular weight 1 × 103 to 2 × 107 Da, The SZ-100V2 Series applies sophisticated intelligence...
Quorom Freeze Dryers for Sample Preparation, Freeze dryers, specifically designed for the careful drying of a range of electron microscopy samples
Freeze dryers, specifically designed for the careful drying of a range of electron microscopy samples
Quorom Glow Discharge for TEM and Surface Modification, Compact, easy-to-use glow discharge system primarily used for the hydrophilisation (wetting) of TEM support films and grids
Compact, easy-to-use glow discharge system primarily used for the hydrophilisation (wetting) of TEM support films and grids
Quorom Bench-Top Vacuum Evaporators
A large chamber system that comes as standard with a carbon rod gun and a metal filament/boat source. 
HORIBA Nanoparticle Characterization, High resolution particle size distribution and visualization with wide range of particle sizes in the same sample. Multiple light sources for Perfect for monitoring nanoparticle kinetics. Fluorescent Particle Analysis, Particle Kinectic Processes, Count and Concentration, Advanced Software
<p>High resolution particle size distribution and visualization with wide range of particle sizes in the same sample.&nbsp;Multiple light sources for Perfect for monitoring nanoparticle kinetics. Fluorescent...
AFM (Atomic Force Microscope) techniques for topographical, electrical and mechanical properties that can be performed with any laser source available in Raman spectrometer, or with other external illumination.